Keysight Released Dual-Channel 20 GHz Signal Generator

The SG6311A doubles signal generation capacity within a compact rack-mount footprint for automated testing.

Updated on Oct. 5, 2026 in Semiconductors

Bold vector editorial illustration of a dual-channel electronic test chassis, emphasizing precision and industrial hardware modularity. — Keysight Technologies released the SG6311A, a new 20 GHz signal generator that combines two independent channels into a single 2U rack-mount chassis for automated testing. AI Illustration. Upload story photo >

Keysight Technologies has released the SG6311A, a 20 GHz analog signal generator featuring two independent signal channels in a 2U chassis. This device is now available for deployment in automated testing environments.

Why it matters

The integration of two signal channels into a 2U form factor increases test throughput for high-density environments where rack space is limited. By maintaining configuration consistency with legacy systems, the design facilitates direct integration into existing automated test benches.

The SG6311A delivers a phase noise of -135 dBc/Hz and amplitude modulation noise of -150 dBc/Hz at 10 GHz with a 10 kHz offset, while maintaining a broadband noise floor of -166 dBc/Hz. It provides a calibrated output power of up to +22 dBm.

The players

Keysight Technologies

A developer of electronic design, emulation, and test hardware used in semiconductor, aerospace, and communications stacks.

The details

The generator utilizes a hybrid architecture that enables configuration through software mode switching. To simplify infrastructure upgrades, the rear-panel connection layout is aligned with earlier instrument models, allowing engineers to retain existing cabling and automation routines. Automation is supported via SCPI, or Standard Commands for Programmable Instruments—a standardized set of commands used to control test equipment.

October 5, 2026: The SG6311A signal generator was released.

The Tech Race

This release follows the industry standard of SCPI-based instrument automation to ensure compatibility with existing testing software ecosystems. The shift toward higher density signal generation reflects a broader move to consolidate test infrastructure while maintaining precise low-noise performance profiles.

Engineers can incorporate the SG6311A into existing rack-mount configurations to parallelize signal testing tasks. The device requires an environment compatible with its SCPI-based automation software to begin operation.

The takeaway

The SG6311A demonstrates how hardware manufacturers are prioritizing footprint efficiency for high-density testing labs. Watch for forthcoming integration guides from the manufacturer to confirm compatibility with legacy test automation scripts.